Nion (company)

Nion Co. was founded in 1997 in Washington State, USA, by Ondrej Krivanek[2] and Niklas Dellby, with a mission to design and build advanced instruments for electron microscopy.Prior to founding Nion, Krivanek and Dellby built a working proof-of-principle aberration corrector for a STEM, in Cambridge UK.Following this success, Philip Batson of IBM TJ Watson Research Center asked them to build an aberration corrector for his STEM.Krivanek was a research professor at University of Washington at the time, and he and Dellby decided to start Nion Co. and build a redesigned corrector.[4] Nion developed such an instrument as its next project: a 100 kV aberration corrected, high-stability electron microscope called UltraSTEM,[5] with resolution capability well below one Angstrom.
SubsidiaryOndrej KrivanekKirklandWashingtonParentBrukermanufacturerscanning transmission electron microscopesWashington State, USATJ Watson Research Centerresearch professorUniversity of WashingtonÅngstromsDaresbury LaboratoryKavli Prizeresolutionelectron microscopesBibcodePhotonics SpectraElectron microscopyHistoryMicrographMicroscopeTimeline of microscope technologyElectronAuger effectBremsstrahlungElectron diffractionElectron scatteringKikuchi linesSecondary electronsX-ray fluorescenceDetectors for transmission electron microscopyElectron gunEverhart–Thornley detectorField electron emissionField emission gunMagnetic lensStigmatorCorrelative light EMCryo-EMLiquid-Phase EMLow-energy EMPhotoemission EMEnvironmental SEMCryoSEMConfocal SEMSEM-XRFCryo-TEMCryo-ET4D STEMAberration-Corrected TEMAnnular dark-field imagingCathodoluminescenceCharge contrast imagingcryoEMDark-field microscopyElectron holographyElectron tomographyImmune electron microscopyGeometric phase analysisPrecession electron diffractionSerial block-face scanning electron microscopyAlbert CreweBodo von BorriesDennis GaborErnst G. BauerErnst RuskaGerasimos DanilatosHarald RoseJames HillierManfred von ArdenneMax KnollMaximilian HaiderNestor J. ZaluzecThomas Eugene EverhartVernon Ellis CosslettVladimir K. ZworykinCarl Zeiss AGFEI CompanyHitachi High-TechnologiesNion CompanyTESCANThermo Fisher ScientificCrysTBoxEM Data BankDirect methodsMultislice