Energy-dispersive X-ray spectroscopy
Hazards and Safety The excess energy of the electron that migrates to an inner shell to fill the newly created hole can do more than emit an X-ray.[3] X-ray photoelectron spectroscopy (XPS) is another close relative of EDS, utilizing ejected electrons in a manner similar to that of AES.WDS differs from EDS in that it uses the diffraction of X-rays on special crystals to separate its raw data into spectral components (wavelengths).The advantage lies in the extremely low capacitance of this anode, thereby utilizing shorter processing times and allowing very high throughput.Further benefits of large area chips include:[citation needed] Where the X-ray energies of interest are in excess of ~ 30 keV, traditional silicon-based technologies suffer from poor quantum efficiency due to a reduction in the detector stopping power.The EDS microcalorimeter has historically suffered from a number of drawbacks, including low count rates and small detector areas.However, the count rate and detector area have been improved by the implementation of arrays of hundreds of superconducting EDS microcalorimeters, and the importance of this technology is growing.
Achmer AerodromeRimicaris exoculataK-alphaK-betaelemental analysischemical characterizationsamplesourceatomic structureemission spectrumspectroscopyMoseley's lawground stateelectron shellselectron holeX-ray detectorelectron microscopesscanning electron microscopesscanning transmission electron microscopesX-ray fluorescencevoltageliquid nitrogensilicon drift detectorsPeltier coolingAuger electronAuger electron spectroscopyX-ray photoelectron spectroscopykinetic energybinding energywavelength dispersive X-ray spectroscopydiffractionmicrophonicselectronsprotonsparticle-induced X-ray emissionsilicon drift detectorstopping powercadmium telluridecadmium zinc telluridehigh energy X-ray imaging technologymicrocalorimetertransition-edge sensorthermometertime constantheat capacityresolutionElemental mappingScanning electron microscopyTransmission electron microscopyX-ray microtomographyBibcodeVibrational (IR)Resonance RamanRotationalRotational–vibrationalVibrationalVibrational circular dichroismNuclear resonance vibrational spectroscopyVibrational spectroscopy of linear moleculesThermal infrared spectroscopyUltraviolet–visibleFluorescenceCold vapour atomicVibronicNear-infraredResonance-enhanced multiphoton ionizationCoherent anti-StokesRaman optical activityLaser-induced breakdownAtomicemissionGlow-discharge opticalabsorptionCavity ring-down spectroscopySaturated absorption spectroscopyExtended X-ray absorption fine structureMössbauerConversion electronPhotoelectron/photoemissionAngle-resolvedTwo-photonphenomenologicalparamagneticBeta spectroscopyInelastic neutron scatteringNeutron spin echoTerahertzESR/EPRFerromagnetic resonanceFourier-transform spectroscopyHyperspectral imagingSpectrophotometryTime-stretchTime-resolved spectroscopyVideo spectroscopyAcoustic resonance spectroscopyCircular dichroism spectroscopyDeep-level transient spectroscopyDual-polarization interferometryHadron spectroscopyInelastic electron tunneling spectroscopyScanning tunneling spectroscopyPhotoacoustic spectroscopyPhotothermal spectroscopyPump–probe spectroscopyAstronomical spectroscopyForce spectroscopyElectron microscopyHistoryMicrographMicroscopeTimeline of microscope technologyElectronAuger effectBremsstrahlungElectron diffractionElectron scatteringKikuchi linesSecondary electronsDetectors for transmission electron microscopyElectron gunEverhart–Thornley detectorField electron emissionField emission gunMagnetic lensStigmator